Congratulations to our PhD student Dominik Ludescher. He won the 3rd prize at the Raith Micrograph Awards with a SEM image of Mie voids for nanoplastic detection.
In this image "A wave of nanoplastic particles" a Mie void sample prior to cleaning can be seen, showcasing voids designed to detect 1 µm spheres. Three voids, two of them perfectly filled with spheres with 1 µm diameter are filled, while a large wave of nanoplastic particles is approaching on the lower part of the image covering several Mie void strucutres. In the dense nanoplastic wave, all three particles sizes (350 nm, 550 nm and 1 µm diameter) are present.